The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 1997
Filed:
Jun. 29, 1993
David G Mahoney, Londonderry, NH (US);
Glenn E Ruiz, Billerica, MA (US);
Jack W Farmer, Sierra Madre, CA (US);
Thomas L Pflanz, Westwood, MA (US);
William D Hall, Deerfield, NH (US);
Roy F Parsons, deceased, late of Dunstable, MA (US);
Varian Associates, Inc., Palo Alto, CA (US);
Abstract
Small, hermetically sealed pans are leak tested after subjecting the finished device to an environment of trace gas such as helium. During the testing process the pans may lose their helium charge by rapid escape due to massive gross leaks. These cases demand pre-helium mass spectrometer leak detector gross leak testing procedure. The non-helium expansion technique, used in conjunction with a helium mass spectrometer leak detector, provides a reliable and automatic gross and fine leak testing of the pans by a single apparatus. The test pan is placed in a sealed test fixture, and a valve between the test fixture and an expansion chamber is opened. The pressure in the expansion chamber is measured after the valve is opened. When the measured pressure is less than a reference pressure, a leaking test pan is indicated. When a sealed test pan is indicated, a helium mass spectrometer leak test is performed to determine the presence of fine leaks in the test part.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile