Pasadena, CA, United States of America

Rongjing Zhang

This inventor holds 1 USPTO granted patent. Top assignee: California Institute of Technology. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rongjing Zhang. Retrieved from https://idiyas.com/inventor/rongjing-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Rongjing Zhang - Innovator in Micro-Electro-Mechanical Systems

Introduction

Rongjing Zhang is a notable inventor based in Pasadena, CA. He has made significant contributions to the field of micro-electro-mechanical systems (MEMS). His innovative work focuses on measuring the mechanical response of these systems, which is crucial for various applications in technology and engineering.

Latest Patents

Rongjing Zhang holds a patent titled "Method and apparatus for measuring the mechanical response of micro-electro-mechanical systems." This invention relates to a method and apparatus that allows for the direct control of the load applied to a MEMS. The system comprises a loading sub-system, a displacement measurement sub-system, and an optional observation sub-system. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Rongjing Zhang is affiliated with the California Institute of Technology, where he continues to advance research in MEMS. His work has implications for improving the performance and reliability of micro-electro-mechanical systems in various industries.

Collaborations

He has collaborated with esteemed colleagues such as Guruswami Ravichandran and Doron Shilo. These partnerships have further enriched his research and innovation efforts.

Conclusion

Rongjing Zhang is a prominent figure in the field of micro-electro-mechanical systems, with a focus on innovative measurement techniques. His contributions are paving the way for advancements in technology and engineering applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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