San Jose, CA, United States of America

Romain Sappey


 

Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 32(Granted Patents)


Location History:

  • San Diego, CA (US) (2009)
  • Tucson, AZ (US) (2010)
  • San Jose, CA (US) (2014 - 2017)

Company Filing History:


Years Active: 2009-2017

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7 patents (USPTO):Explore Patents

Title: Inventor Spotlight: Romain Sappey

Introduction

Romain Sappey, an innovative inventor based in San Jose, California, has made significant contributions to the field of defect detection and photoluminescence measurement. With an impressive portfolio of 7 patents, Sappey continues to push the boundaries of technology, enhancing methodologies in his area of expertise.

Latest Patents

Sappey’s latest patents showcase his deep knowledge and creativity in his work. One notable invention, titled "System and method for defect detection and photoluminescence measurement of a sample," involves directing beams of oblique and normal illumination onto a sample. This method effectively detects photoluminescent defects by measuring scattered radiation and separating it into different portions for analysis.

Additionally, his patent "Methods and apparatus for spectral luminescence measurement" outlines a computer-implemented method for processing spectral luminescence mapping data. This technique focuses on quantifying the luminescence spectrum of substrates with epitaxial layer stacks. By employing sophisticated calculations, it can determine essential parameters such as peak wavelength and epi thickness, making significant advancements in the field.

Career Highlights

Romain Sappey is currently associated with KLA-Tencor Corporation, a leading company in process control and yield management solutions. His role at KLA-Tencor allows him to collaborate on cutting-edge technologies that are vital in maintaining the quality of semiconductor manufacturing. His portfolio of patents reflects his commitment to addressing complex challenges within this industry.

Collaborations

Throughout his career, Sappey has worked alongside talented colleagues such as Steven W. Meeks and Shouhong Tang. Their collaborative efforts have led to innovative breakthroughs and enhanced research methodologies in defect detection and luminescence measurement.

Conclusion

Romain Sappey is a distinguished figure in the field of photoluminescence and defect detection. His contributions, through his patents and collaborations, signify a commitment to advancing technology and improving processes in semiconductor manufacturing. As innovation continues to evolve, Sappey remains a key player in shaping the future of this important industry.

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