Riehen, Switzerland

Rolf Wiesendanger

This inventor holds 12 USPTO granted patents, plus 1 CIPO patent and 1 EPO patent. Top assignees: Huntsman Advanced Materials Americas LLC, Ciba-Geigy Corporation, Vantico Limited. Active years: 1995-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rolf Wiesendanger. Retrieved from https://idiyas.com/inventor/rolf-wiesendanger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 75.0



Average Co-Inventor Count = 3.7

ph-index = 4

Forward Citations = 125(Granted Patents)


Location History:

  • Basel, CH (1995 - 1997)
  • Riehen, CH (1996 - 2007)

Company Filing History:


Years Active: 1995-2007

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12 patents (USPTO):Explore Patents

Title: Rolf Wiesendanger - Pioneer in Nanotechnology

Introduction: Rolf Wiesendanger, a distinguished inventor hailing from Riehen, Switzerland, is renowned for his groundbreaking contributions to the field of nanotechnology.

Latest Patents: Rolf Wiesendanger holds several patents in the field of scanning tunneling microscopy and atomic force microscopy, revolutionizing the way researchers observe and manipulate matter at the nanoscale.

Career Highlights: With a career spanning over three decades, Wiesendanger has held prestigious positions at leading research institutions and universities, where he has conducted pioneering research in nanoscience and nanotechnology.

Collaborations: Throughout his career, Rolf Wiesendanger has collaborated with top scientists and research institutions worldwide, fostering innovation and pushing the boundaries of nanotechnology.

Conclusion: Rolf Wiesendanger's relentless pursuit of excellence and innovation has solidified his reputation as a trailblazer in the field of nanotechnology, inspiring future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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