This inventor holds 2 USPTO granted patents. Top assignees: Telefunken Electronic Gmbh, Temic Telefunken Microelectronic Gmbh. Active years: 1988-2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1988-2000
Title: Rolf Jager: Innovator in Product Testing and Fault Detection
Introduction
Rolf Jager is a notable inventor based in Talheim, Germany. He has made significant contributions to the field of product testing and fault detection, holding a total of 2 patents. His innovative methods have enhanced the efficiency and accuracy of testing processes in various industries.
Latest Patents
Rolf Jager's latest patents include a "Method for testing a large quantity of products" and a "Process for fault detection on defined structures." The first patent describes a method where every product is subjected to at least one test mode, carried out in a sequence that allows for statistical information to be utilized. This method ensures that the order of measurement operations is optimized based on fault frequency and functional dependencies. The second patent focuses on detecting faults in the structures of electrical components by scanning them with a test beam, allowing for immediate identification of structure faults or deviations.
Career Highlights
Throughout his career, Rolf Jager has worked with prominent companies such as Telefunken Electronic GmbH and Temic Telefunken Microelectronic GmbH. His experience in these organizations has contributed to his expertise in the field of electronics and testing methodologies.
Collaborations
Rolf has collaborated with notable coworkers, including Horst Polomsky and Ralf Gutmann. Their combined efforts have further advanced the innovations in product testing and fault detection.
Conclusion
Rolf Jager's contributions to the field of testing and fault detection are significant, showcasing his innovative spirit and dedication to improving product quality. His patents reflect a deep understanding of the complexities involved in testing processes, making him a valuable figure in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile