The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2000
Filed:
Aug. 07, 1997
Ralf Gutmann, Jagsthausen, DE;
Rolf Jager, Talheim, DE;
Temic Telefunken Microelectronic GmbH, Heilbronn, DE;
Abstract
A method of testing a large number of products in which every product to be tested is subjected to at least one test mode that is carried out in a test sequence successively on all products by means of a test operation comprising several successively performed measurement operations, where statistical information on the test operation of products already tested is allowed for and where a test result is allocated for every product tested. In every test mode the order of the measurement operations of a test operation is specified such that the measurement operations are arranged in accordance with their fault frequency per measurement time and the functional dependencies between the measurement operations. Every test operation within the test sequence of a test mode is allocated a measurement mode which has a certain quantity of measurement operations to be performed and which is specified in accordance with the quantity and the products already tested in a test sequence.