Milpitas, CA, United States of America

Rohit Patnaik

This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rohit Patnaik. Retrieved from https://idiyas.com/inventor/rohit-patnaik-ey8eved4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Rohit Patnaik: Innovator in High-Resolution Imaging Technology

Introduction

Rohit Patnaik is a notable inventor based in Milpitas, California. He has made significant contributions to the field of imaging technology, particularly in the area of high-resolution point spread functions.

Latest Patents

Rohit holds a patent for a "System and method for reconstructing high-resolution point spread functions from low-resolution inspection images." This innovative method involves acquiring low-resolution images of a wafer, aggregating these images, estimating sub-pixel shifts, and reconstructing high-resolution point spread functions from the aggregated low-resolution image patches.

Career Highlights

Rohit is currently employed at Kla Tencor Corporation, where he applies his expertise in imaging technology. His work focuses on enhancing the quality and accuracy of imaging systems, which is crucial for various applications in the semiconductor industry.

Collaborations

Rohit has collaborated with notable colleagues, including Helen Heng Liu and Stephen Osborne. Their combined efforts contribute to advancements in imaging technology and the development of innovative solutions.

Conclusion

Rohit Patnaik's work in high-resolution imaging technology exemplifies the impact of innovation in the semiconductor industry. His contributions continue to shape the future of imaging systems and enhance their capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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