Company Filing History:
Years Active: 2026
Title: Rohit Kawde: Innovator in Film Thickness Estimation
Introduction
Rohit Kawde is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of film thickness estimation, particularly in the semiconductor industry. His innovative approach has led to the development of a unique method that enhances the accuracy of film thickness measurements.
Latest Patents
Rohit Kawde holds a patent for a method of producing a model for estimating film thickness of a workpiece. This patent, titled "Method of producing a model for estimating film thickness of workpiece, method of estimating film thickness of workpiece using such a model, and computer readable storage medium storing program for causing computer to perform the methods," addresses the challenges posed by spectral variation of reflected light from workpieces, such as wafers. The method involves determining sample features that represent the characteristics of sample spectra of reflected lights, calculating similarities between these spectra and a representative spectrum, and producing a film-thickness estimation model through machine learning techniques. He has 1 patent to his name.
Career Highlights
Rohit Kawde is currently employed at Ebara Corporation, where he applies his expertise in film thickness estimation. His work has been instrumental in advancing the technology used in semiconductor manufacturing. His innovative methods have garnered attention and recognition within the industry.
Collaborations
Rohit collaborates with talented individuals such as Nachiketa Chauhan and Keita Yagi. Their combined efforts contribute to the ongoing development of advanced technologies in their field.
Conclusion
Rohit Kawde is a prominent inventor whose work in film thickness estimation has made a significant impact in the semiconductor industry. His innovative methods and collaborations continue to drive advancements in technology.