Company Filing History:
Years Active: 2007
Title: The Innovative Mind of Roger Mar in Digital Circuit Testing
Introduction
Roger Mar, located in San Diego, California, is a prominent inventor recognized for his contributions to the field of digital electronics. With one patent to his name, he has made significant advancements in the testing methodologies for digital-to-analog converters (DACs) and analog-to-digital converters (ADCs). His work is characterized by a focus on efficiency and accuracy in testing complex circuit designs.
Latest Patents
Roger Mar's patent, titled "Digital BIST Test Scheme for ADC/DAC Circuits," introduces a generalized method for testing DACs and ADCs. This innovative scheme allows for the pair testing of DACs and ADCs using a Digital Tester along with on-chip test circuitry. By enabling the testing at the highest clock frequency specified, Roger has effectively shortened the overall test time. The design of the test circuits includes critical components such as two multiplexer cells and an internal Analog Test Bus, making the testing process versatile enough to accommodate various combinations of DACs and ADCs on the same integrated circuit. This method can also identify faults by allowing an ADC to be tested with multiple DACs or vice versa.
Career Highlights
Roger Mar works at Toshiba America Electronic Components, Inc., a well-regarded company in the electronics industry. His contributions have positively impacted the testing processes used within the company and have set a standard for future innovations in digital circuit testing.
Collaborations
Throughout his career, Roger has collaborated with talented coworkers, including Luverne Ray Peterson and Jonathan A Levi. Together, they have fostered an environment of creativity and innovation, driving advancements in electronic testing methodologies while sharing valuable insights and expertise.
Conclusion
The inventive spirit of Roger Mar has greatly enriched the field of digital circuit testing. His patented digital BIST test scheme represents a leap forward in efficiently testing DACs and ADCs, contributing to advancements in electronic design and testing practices. As he continues to innovate, the impact of his work is likely to resonate within the industry for years to come.