This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Malvern Panalytical B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Roelof De Vries, X-Ray Detection Inventor
Introduction
Roelof De Vries is an inventor associated with Malvern Panalytical B.V. in Almelo, the Netherlands. His work includes inventions for X-ray diffraction analysis.
Latest Patents
De Vries is credited with 2 patents. One of his latest patents, “X-Ray Detector for X-Ray Diffraction Analysis Apparatus,” describes a method for identifying charge-sharing and coincident-photon events. The apparatus analyzes the time delay between pulses from two detector cells and the energy of each pulse to distinguish between these events.
Career Highlights
De Vries’s patent work is connected to Malvern Panalytical B.V., a company focused on analytical instrumentation. His disclosed invention addresses signal processing in X-ray diffraction equipment.
Collaborations
His listed coworkers include Vladimir Jovanovic and Sander Weijers.
Conclusion
Roelof De Vries’s patent activity includes detector and signal-processing technology designed to help identify events in X-ray diffraction analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile