Robertus W Dekker

Title: The Innovations of Robertus W Dekker

Introduction

Robertus W Dekker is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of integrated circuit testing and data processing systems. With a total of 3 patents, his work has had a lasting impact on technology.

Latest Patents

One of Dekker's latest patents is a method for testing an integrated circuit means having a hierarchical structure. This method involves sequentially attacking each assembly and executing an assembly test cycle for each macro within the assembly. The test run is conditionally executed under the control of a macro test mode (MTM) signal. The method is versatile and can be applied to separate integrated circuits or to a wired board with multiple circuits.

Another significant patent is related to controlling a self-test in a data processing system. This method describes how control patterns are transported via a shift register and passed to a subsystem for testing. The results of the test are then loaded back into the shift register, allowing for efficient testing without the need for special connections.

Career Highlights

Robertus W Dekker is associated with U.S. Philips Corporation, where he has been instrumental in developing innovative testing methods for integrated circuits. His expertise in this area has contributed to advancements in the reliability and efficiency of electronic systems.

Collaborations

Dekker has worked alongside notable colleagues such as Franciscus P Beenker and Joris F Jansen. Their collaborative efforts have further enhanced the quality and scope of their innovations.

Conclusion

Robertus W Dekker's contributions to the field of integrated circuits and data processing systems exemplify the spirit of innovation. His patents reflect a deep understanding of technology and a commitment to improving electronic testing methods.