Chester, NY, United States of America

Robert Wayne Nywening


Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2002-2005

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2 patents (USPTO):Explore Patents

Title: The Innovations of Robert Wayne Nywening

Introduction

Robert Wayne Nywening is a notable inventor based in Chester, NY (US). He has made significant contributions to the field of integrated circuits, particularly in the testing of active matrix display arrays. With a total of 2 patents to his name, Nywening's work has had a considerable impact on display technology.

Latest Patents

Nywening's latest patents include "Integrated circuits for testing an active matrix display array" and "Integrated circuits for testing a display array." The first patent describes a device designed for use in a display system that includes an array of pixel cells formed on a substrate. Each pixel cell is coupled to at least one gate line and one data line. The device features first and second transistors, with voltage applied to the gate electrode controlling the conductivity of the channel region. The second patent presents an improved apparatus for testing an array of pixel cells, which partitions gate lines and data lines into groups. This design allows for a flexible interface between the array under test and the test system, minimizing redesign costs when the size or resolution of the array changes.

Career Highlights

Nywening is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of display technology. His work has been instrumental in advancing the capabilities of integrated circuits used in testing display arrays.

Collaborations

Some of Nywening's coworkers include Leslie C Jenkins and Frank Robert Libsch, who have collaborated with him on various projects within IBM.

Conclusion

Robert Wayne Nywening's contributions to integrated circuits and display technology highlight his role as a significant inventor in the field. His patents reflect a commitment to innovation and improvement in testing methodologies for display systems.

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