The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Jan. 28, 1999
Leslie Charles Jenkins, Howes Caves, NY (US);
Frank Robert Libsch, White Plains, NY (US);
Michael Patrick Mastro, Yorktown Heights, NY (US);
Robert Wayne Nywening, Chester, NY (US);
Robert John Polastre, Cold Spring, NY (US);
Leslie Charles Jenkins, Howes Caves, NY (US);
Frank Robert Libsch, White Plains, NY (US);
Michael Patrick Mastro, Yorktown Heights, NY (US);
Robert Wayne Nywening, Chester, NY (US);
Robert John Polastre, Cold Spring, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A device for use in a display system including an array of pixel cells formed on a substrate. Each pixel cell being coupled to at least one gate line of a plurality of gate lines formed on the substrate and at least one data line of a plurality of data lines being formed on the substrate. The device includes first and second transistors formed on the substrate. Each transistor has a gate electrode and first and second electrodes defining a serpentine channel region there between voltage applied to the gate electrode controls conductivity of the channel region. Preferably, a common electrode includes one of the first and second electrodes of the first transistor and one of the first and second electrodes of the second transistor. The first and second transistors are preferably coupled between a gate line (or data line) and respective probe pads formed on the substrate and selectively couple the respective probe pad to the gate line (or data line) during a test routine whereby charge is written to, stored, and read from the array of pixel cells.