Robert W Daywitt

Title: Robert W Daywitt: Innovator in Semiconductor Testing

Introduction

Robert W Daywitt is a notable inventor based in Tempe, AZ (US). He has made significant contributions to the field of semiconductor testing, particularly through his innovative patent that enhances the accuracy of IDDQ testing methods.

Latest Patents

Robert W Daywitt holds a patent titled "Defect Insertion Testability Mode for IDDQ Testing Methods." This invention focuses on detecting defects in semiconductor devices and improving accuracy during testing. In one embodiment, a screen condition and a known defect current are selected for the device under test (DUT). The DUT is screened without a known defect current being inserted and then screened again with a known defect current inserted. The results of screening the DUT with and without the known defect current are compared, and the screen condition is adjusted based on this comparison to increase the accuracy of the IDDQ test.

Career Highlights

Robert W Daywitt is currently employed at Intel Corporation, a leading technology company known for its semiconductor products. His work at Intel has allowed him to contribute to advancements in semiconductor testing methodologies.

Collaborations

One of his notable coworkers is Jeffrey C Kalb, Jr., with whom he has likely collaborated on various projects within the semiconductor testing domain.

Conclusion

Robert W Daywitt's innovative work in semiconductor testing exemplifies the importance of accuracy in technology development. His contributions continue to influence the field and enhance the reliability of semiconductor devices.