Robert W Bollish

Title: Innovations by Robert W Bollish in Wafer-Level Testing

Introduction

Robert W Bollish, an accomplished inventor based in Austin, Texas, has made significant contributions in the field of integrated circuit testing. With a total of three patents to his name, Bollish's innovations are pivotal in enhancing the reliability and efficiency of semiconductor testing processes.

Latest Patents

Bollish's latest patents focus on advanced methodologies for wafer-level testing of integrated circuits. One notable patent is for an "Apparatus for performing wafer-level testing of integrated circuits." This invention introduces a system where multiple segmented bus regions are utilized to isolate test conductors, allowing for the effective testing of high-powered integrated circuits. By incorporating contact pads within the active areas of the circuits, the invention aims to mitigate issues related to speed, power, and throughput during testing.

Another significant patent by Bollish is the "Apparatus for performing wafer level testing of integrated circuit dice." This invention involves a semiconductor wafer equipped with integrated circuit dice and designated wafer conductors. The design enables electrical signals to flow seamlessly to and from the integrated circuits, facilitating comprehensive testing and burn-in processes. The structure of this system streamlines the connection by ensuring that each wafer conductor aligns with the same bonding pad across the integrated circuit dice.

Career Highlights

Bollish has built a remarkable career at Motorola Corporation, where he has honed his expertise in semiconductor technology and testing. His contributions significantly impact the efficiency of how integrated circuits are validated, especially in high-volume manufacturing environments.

Collaborations

Throughout his career, Bollish has collaborated with talented professionals, including colleagues Edward C Dasse and Alfredo Figueroa. These collaborations have undoubtedly enriched his work and fostered an environment of innovation that benefits the field of integrated circuit technology.

Conclusion

In summary, Robert W Bollish stands out as an innovative inventor whose patents in wafer-level testing have transformed how integrated circuits are assessed. His work not only enhances testing efficiency but also lays a solid foundation for future advancements in semiconductor technologies. His dedication to innovation makes him a notable figure in the realm of integrated circuit testing.