Coopersburg, PA, United States of America

Robert T Smith

This inventor holds 1 USPTO granted patent. Top assignee: Lucent Technologies Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert T Smith. Retrieved from https://idiyas.com/inventor/robert-t-smith-alix0aa6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2001

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Robert T. Smith

Introduction

Robert T. Smith is a notable inventor based in Coopersburg, PA (US). He has made significant contributions to the field of integrated circuits, particularly in quality and reliability assurance testing. His innovative methods have streamlined processes in fabrication facilities, enhancing efficiency and reliability.

Latest Patents

Robert T. Smith holds a patent for a method titled "Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-in." This patent outlines a process for testing the differential current of a sample of integrated circuits (ICs) at various voltages. The method involves burning-in a sample of ICs and subsequently testing their functionality. This innovative approach allows for the reliability of an entire lot of ICs to be assessed, eliminating the need for extensive burn-in and post burn-in testing for future lots.

Career Highlights

Robert T. Smith is associated with Lucent Technologies Inc., where he has contributed to advancements in integrated circuit technology. His work has not only improved testing methods but has also allowed fabrication facilities to allocate resources more effectively.

Collaborations

Throughout his career, Robert has collaborated with esteemed colleagues such as Thomas N. Hofacker and Richard J. Jenkins. These collaborations have further enriched his contributions to the field of integrated circuits.

Conclusion

Robert T. Smith's innovative methods in quality and reliability assurance testing have made a lasting impact on the integrated circuit industry. His patent reflects a significant advancement in testing efficiency, showcasing his dedication to improving technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…