Dresden, Germany

Robert Pomraenke

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Smt Gmbh. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Pomraenke. Retrieved from https://idiyas.com/inventor/robert-pomraenke-9pgk5di9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Robert Pomraenke - Innovator in Optical Systems

Introduction

Robert Pomraenke is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of optical systems, particularly through his innovative patent. His work is recognized for its impact on the measurement and analysis of optical performance.

Latest Patents

Robert Pomraenke holds a patent for a "Test object for measuring the point spread function of an optical system." This invention features a structure designed to measure the point spread function (PSF) of an optical system with a specified Airy diameter. The test object includes multiple structure elements arranged to create a design with at least two axes of symmetry, enhancing the accuracy of optical measurements.

Career Highlights

Pomraenke is associated with Carl Zeiss SMT GmbH, a leading company in the field of optical systems and technologies. His role at the company has allowed him to work on cutting-edge projects that advance optical measurement techniques.

Collaborations

Throughout his career, Robert has collaborated with talented professionals, including Lars Stoppe and Michael Arnz. These partnerships have contributed to the development of innovative solutions in optical technology.

Conclusion

Robert Pomraenke's contributions to optical systems through his patent and work at Carl Zeiss SMT GmbH highlight his role as a key innovator in the field. His dedication to advancing optical measurement techniques continues to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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