Company Filing History:
Years Active: 1998
Title: The Innovations of Robert Marshall Stowell
Introduction
Robert Marshall Stowell is an accomplished inventor based in West Linn, Oregon. He has made significant contributions to the field of scanning probe microscopy, holding a total of 2 patents. His work focuses on enhancing measurement accuracy and protecting probe tips during operation.
Latest Patents
Stowell's latest patents include a "Method for protecting a probe tip using active lateral scanning control." This invention involves a scanning probe microscope that utilizes a detection mechanism to produce a feedback signal. This signal indicates the condition of engagement between the scanning probe and the sample surface. When the engagement exceeds a certain threshold, the lateral scanning movement is halted to prevent potential damage to the probe. The scanning movement is only resumed once the probe is safely distanced from the sample surface.
Another notable patent is the "Method for improving measurement accuracy using active lateral scanning." This invention describes a scanning probe microscope where the probe is moved into and out of engagement with a sample surface. It employs a combination of fast and slow actuators to ensure precise measurements. The fast actuator operates within a predetermined range, while the slow actuator is activated when necessary to maintain accuracy during scanning.
Career Highlights
Stowell is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of microscopy. His work has significantly advanced the capabilities of scanning probe technology, making it more reliable and efficient.
Collaborations
Throughout his career, Stowell has collaborated with notable colleagues, including Edwin Flecha and Kenneth Gilbert Roessler. These partnerships have contributed to the development of his innovative patents and have fostered a collaborative environment for research and development.
Conclusion
Robert Marshall Stowell's contributions to scanning probe microscopy demonstrate his commitment to innovation and excellence in his field. His patents reflect a deep understanding of the technology and a desire to improve measurement accuracy and probe protection. His work continues to influence the industry and inspire future advancements.