The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1998
Filed:
May. 21, 1997
Edwin Flecha, Boca Raton, FL (US);
Kenneth Gilbert Roessler, Boca Raton, FL (US);
Robert Marshall Stowell, West Linn, OR (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A scanning probe microscope includes a detection mechanism producing a feedback signal indicating a condition of engagement between the scanning probe and the surface of a sample being examined. When this engagement is above a threshold level, the lateral scanning movement between the probe and sample is stopped. The scanning movement occurs in incremental movements, and a feedback signal above the threshold level indicates that, if the scanning movement were to continue, the probe could not be moved upward fast enough to prevent a crash condition between the probe and the sample surface. The scanning movement is not re-started until the feedback signal indicates that the probe has been moved far enough away from the sample surface that such a crash condition can be avoided during the next incremental movement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile