Vienna, Austria

Robert Kirmse

This inventor holds 1 USPTO granted patent. Top assignee: Leica Mikrosysteme Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Kirmse. Retrieved from https://idiyas.com/inventor/robert-kirmse-x2zvkmvi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Robert Kirmse

Introduction

Robert Kirmse is a notable inventor based in Vienna, Austria. He has made significant contributions to the field of microscopy through his innovative methods and systems. His work focuses on enhancing the precision and efficiency of microscopic sample analysis.

Latest Patents

Robert Kirmse holds a patent for a method that generates a series of ultra-thin sections using an ultramicrotome. This method involves detaching sections from a microscopic sample and making them float on a liquid surface before transferring them onto a solid carrier element. The process also includes determining the position and orientation of the sections on the carrier element using a monitoring system equipped with a camera, which collects valuable monitoring data. He has 1 patent related to this groundbreaking technology.

Career Highlights

Kirmse's career is marked by his association with Leica Mikrosysteme GmbH, where he has been instrumental in developing advanced ultramicrotome systems. His expertise in microscopy has positioned him as a key figure in the field, contributing to the advancement of scientific research and analysis.

Collaborations

Robert Kirmse has collaborated with esteemed colleagues, including Robert Lange and Peer Oliver Kellermann. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in microscopy.

Conclusion

Robert Kirmse's contributions to the field of microscopy through his innovative methods and systems have made a lasting impact. His work continues to influence the way microscopic samples are analyzed and understood.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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