The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 17, 2021
Applicant:

Leica Mikrosysteme Gmbh, Vienna, AT;

Inventors:

Robert Kirmse, Vienna, AT;

Robert Lange, Vienna, AT;

Peer Oliver Kellermann, Vienna, AT;

Robert Ranner, Vienna, AT;

Mario Noessing, Vienna, AT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/06 (2006.01); G01N 1/28 (2006.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01N 1/06 (2013.01); G01N 1/2813 (2013.01); G06T 7/0012 (2013.01); G06T 7/70 (2017.01); G06T 2207/10061 (2013.01); G06T 2207/30024 (2013.01);
Abstract

A method for generating a series of ultra-thin sections of a microscopic sample is provided. The method includes detaching the sections from the sample using an ultramicrotome. The sections detached from the sample are made to float on a liquid surface and thereafter are transferred onto a solid carrier element. The method also includes determining, for at least one of the sections detached from the sample, a position and an orientation on the solid carrier element by monitoring the placement of the sections onto the solid carrier element using a monitoring system comprising a camera, and obtaining monitoring data.


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