This inventor holds 4 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 1999-2003.
Company Filing History:
Years Active: 1999-2003
Title: The Innovations of Robert J. Hatfield
Introduction
Robert J. Hatfield is a notable inventor based in Boise, Idaho. He has made significant contributions to the field of technology, particularly in the area of endpoint detection for material stripping processes. With a total of 4 patents to his name, Hatfield's work has had a considerable impact on the industry.
Latest Patents
One of Hatfield's latest patents is a method and apparatus employing an external light source for endpoint detection. This innovative technology involves projecting a beam of light onto a substrate surface to detect the stripping of materials, such as photo-resist material. The fluoresced and/or reflected light intensity at a specific wavelength band is measured by a light detector. The light intensity is then converted into a numerical value and transmitted electronically to a control mechanism. This mechanism determines the appropriate disposition of the substrate and controls the cessation of the stripping process. Additionally, it may manage a substrate-handling device that sequentially transfers substrates to and from a stripping chamber.
Career Highlights
Robert J. Hatfield is currently employed at Micron Technology Incorporated, where he continues to innovate and develop new technologies. His work at Micron has allowed him to collaborate with other talented professionals in the field.
Collaborations
Some of Hatfield's notable coworkers include David R. Johnson and Joe Lee Phillips. Their combined expertise contributes to the advancement of technology at Micron.
Conclusion
Robert J. Hatfield's contributions to the field of technology, particularly through his innovative patents, demonstrate his commitment to advancing endpoint detection methods. His work continues to influence the industry and showcases the importance of innovation in technology.