Company Filing History:
Years Active: 2002-2003
Title: Innovations of Robert David Conklin
Introduction
Robert David Conklin is a notable inventor based in Chandler, AZ (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 8 patents. His work focuses on developing advanced algorithmic pattern generators that enhance the efficiency and accuracy of testing IC chips.
Latest Patents
Conklin's latest patents include an initial stage of a multi-stage algorithmic pattern generator for testing IC chips. This innovative design generates bit streams for testing IC chips and comprises multiple sets of input registers that store respective addresses. It features an address modifying circuit that selects one register in a set and generates a modified address through arithmetic operations. Additionally, the initial stage includes a boundary check circuit that ensures generated addresses remain within specified limits, thereby optimizing the testing process.
Another significant patent is the output stage of a multi-stage algorithmic pattern generator. This stage generates bit streams for testing IC chips and consists of multiple input registers that hold input addresses and data words. A multiplexer circuit selectively passes bits from these inputs in response to control signals, creating serial bit streams that define both data inputs and expected outputs for the integrated circuit chip being tested.
Career Highlights
Robert David Conklin is currently employed at Unisys Corporation, where he continues to innovate in the field of integrated circuit testing. His work has been instrumental in advancing the technology used in testing IC chips, making the process more efficient and reliable.
Collaborations
Conklin has collaborated with notable colleagues such as James Rhodes and Timothy Allen Barr. Their combined expertise has contributed to the development of cutting-edge technologies in the realm of integrated circuits.
Conclusion
Robert David Conklin's contributions to the field of integrated circuit testing through his innovative patents and collaborations highlight his significant role as an inventor. His work continues to influence the industry and improve testing methodologies for IC chips.