Singapore, Singapore

Robert Alexander Lockey

This inventor holds 1 USPTO granted patent. Top assignee: Leica Instruments (Singapore) Pte. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Alexander Lockey. Retrieved from https://idiyas.com/inventor/robert-alexander-lockey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Robert Alexander Lockey: Advancing Microscope Systems

Introduction

Robert Alexander Lockey is an inventor associated with Singapore and Leica Instruments (Singapore) Pte. Ltd. His patent work concerns microscope technology, including systems designed to create computer-generated views of samples from an observer’s viewing angle.

Latest Patents

Lockey is credited with 1 patent: “Microscope system and system, method, and computer program for a microscope system.” The invention describes a microscope system, such as a surgical microscope, that obtains sensor data representing a view of a sample. It uses the data to determine a three-dimensional representation of the sample, identifies the observer’s viewing angle, and generates a corresponding computer-generated view for display.

Career Highlights

The patent reflects work at the intersection of microscopy, sensor data, three-dimensional representation, and computer-generated visualization. The described approach aims to adapt the displayed view of a sample to the observer’s perspective.

Collaborations

Lockey’s listed company affiliation is Leica Instruments (Singapore) Pte. Ltd. His listed coworker is Miguel Diez-ochoa.

Conclusion

Robert Alexander Lockey’s patent focuses on perspective-aware visualization for microscope systems, combining sensor input and three-dimensional sample representation to generate a view suited to the observer.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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