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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12730294 B1

PDFFull Text
Date of Patent:
Sep. 08, 2026

Filed:

Mar. 08, 2023

Microscope system and system, method, and computer program for a microscope system

Applicant:

Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Miguel Diez-Ochoa, Singapore, SG;

Robert Alexander Lockey, Singapore, SG;

Assignee:

Leica Instruments (Singapore) Pte Ltd., Singapore, SG;

Attorneys:

2SPL Patent Attorneys PartG mbB

Yong Beom Hwang

Primary Examiner:

Said Broome

Assistant Examiner:

Jordan Wan Yick

Int. Cl.
CPC ...
G02B 21/22 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 30/22 (2020.01); G06F 3/01 (2006.01); G06T 7/593 (2017.01); G06T 7/90 (2017.01); G06T 15/20 (2011.01); H04N 13/00 (2018.01); H04N 13/239 (2018.01);
U.S. Cl.
CPC ...
G02B 21/22 (2013.01); G01N 21/6458 (2013.01); G02B 21/0012 (2013.01); G02B 21/16 (2013.01); G02B 21/368 (2013.01); G02B 30/22 (2020.01); G06F 3/012 (2013.01); G06T 7/593 (2017.01); G06T 7/90 (2017.01); G06T 15/205 (2013.01); H04N 13/239 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30004 (2013.01); G06T 2210/41 (2013.01); H04N 2013/0081 (2013.01);
Abstract

Examples relate to a microscope system, such as surgical microscope system, and to a system, a method, and a computer program for a microscope system. The system is configured to obtain sensor data of at least one sensor of the microscope system, the sensor data representing a view of a sample being observed through a microscope of the microscope system. The system is configured to determine a three-dimensional representation of the sample based on the sensor data. The system is configured to determine information on a viewing angle of an observer. The system is configured to determine a computer-generated view of the sample from the viewing angle of the observer based on the three-dimensional representation of the sample. The system is configured to generate a display signal for a display device, the display signal comprising the computer-generated view of the sample.

Find Patent Forward Citations

Diez-Ochoa, Miguel. (2026). Microscope system and system, method, and computer program for a microscope system (U.S. Patent No. 12730294). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12730294

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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