Ritesh K Soni

Title: Ritesh K. Soni and Test Abstraction Data Models.

Introduction

Ritesh K. Soni is an inventor based in Austin, Texas. His work includes a patent for methods and computing devices that match an instrument to a device under test (DUT) for carrying out a test procedure.

Latest Patents

Soni’s listed patent, “Test Abstraction Data Model,” describes a way to determine whether an instrument is suitable for testing a DUT. The method builds a data structure from the instrument’s data sheet, recording its attributes, the phenomena it can measure, and the testing interactions used for those measurements. It also creates a test case from the procedure to be performed on the DUT. The system compares the instrument and test-case information to identify a match and outputs instructions based on the result. Soni is credited with 1 patent.

Career Highlights

Soni is associated with National Instruments Corporation. His patent reflects work on organizing instrument capabilities and test requirements into a model that can support instrument selection and test execution.

Collaborations

Soni’s listed coworkers include Andrew Philip Dove and Jan Viborg Moeller.

Conclusion

Ritesh K. Soni’s patented test abstraction data model addresses the practical challenge of matching measurement instruments with test procedures, connecting instrument specifications to the requirements of a device under test.