The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Feb. 22, 2023
National Instruments Corporation, Austin, TX (US);
Andrew Philip Dove, Austin, TX (US);
Jan Viborg Moeller, Greve, DK;
Ritesh K. Soni, Austin, TX (US);
Joseph E. Peck, Hutto, TX (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile