Company Filing History:
Years Active: 2006-2009
Title: Rie Itoh: Innovator in Frequency Sensors and Semiconductor Devices
Introduction
Rie Itoh is a prominent inventor based in Osaka, Japan. She has made significant contributions to the fields of frequency sensors and semiconductor devices. With a total of 2 patents, her work showcases her innovative spirit and technical expertise.
Latest Patents
Rie Itoh's latest patents include a frequency sensor and a semiconductor device. The frequency sensor is designed to include at least one resistor element and a capacitor. It detects frequency based on the charging and discharging time of the capacitor, achieving reduced power consumption and a smaller circuit scale. The design allows for multiple resistors and capacitors, along with switches connected to each component. Additionally, the time constant can be adjusted post-production to minimize variations. A self-diagnosis circuit can also be integrated to ensure the frequency sensor operates reliably.
The semiconductor integrated circuit device consists of an LSI function unit and a shield wiring layer. The LSI function unit includes a semiconductor substrate and a first insulating film, with circuit elements such as MOS transistors. The shield wiring layer is composed of lower and upper shield lines, along with multiple insulating films, arranged in intersecting directions to enhance performance.
Career Highlights
Rie Itoh has worked with notable companies such as Matsushita Electric Industrial Co., Ltd. and Panasonic Corporation. Her experience in these organizations has contributed to her development as an inventor and innovator in her field.
Collaborations
Rie has collaborated with esteemed colleagues, including Noriaki Matsuno and Masato Tsunoda. Their teamwork has fostered an environment of innovation and creativity.
Conclusion
Rie Itoh's contributions to frequency sensors and semiconductor devices highlight her role as a leading inventor in Japan. Her patents reflect her commitment to advancing technology and improving device reliability.