Fremont, CA, United States of America

Richard W Prior

This inventor holds 3 USPTO granted patents and 1 published patent application, plus 1 CIPO patent. Top assignees: Etec Systems, Inc., Applied Materials, Inc.. Active years: 1994-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard W Prior. Retrieved from https://idiyas.com/inventor/richard-w-prior

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0


Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 23(Granted Patents)


Location History:

  • Fremont, CA (US) (1994)
  • Union City, CA (US) (2001 - 2003)

Company Filing History:


Years Active: 1994-2003

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3 patents (USPTO):Explore Patents

Title: Richard W. Prior: Innovator in Electronically Measuring Beam Parameters

Introduction

Richard W. Prior is an accomplished inventor based in the United States. He has made significant contributions to the field of electronically measuring beam parameters. His innovative approach has the potential to enhance the accuracy and efficiency of raster scan systems.

Latest Patents

Richard W. Prior holds a notable patent titled "Method And Structure For Electronically Measuring Beam Parameters." This patent outlines a method for electronically measuring parameters of a beam in a raster scan system. The process involves selecting a predetermined pixel for calibration, moving a grid adjacent to this pixel, and strobing the beam. The method includes incrementally moving the beam toward an axis of the grid and integrating the resulting signal as the beam approaches the axis. This procedure is repeated until the beam crosses the axis, allowing for precise determination of the grid's relative position.

Career Highlights

Richard W. Prior is associated with Etec Systems, Inc., where he applies his expertise in beam measurement technologies. His work focuses on advancing the capabilities of raster scan systems, contributing to the development of more accurate measurement techniques.

Conclusion

Richard W. Prior's innovative methods in electronically measuring beam parameters demonstrate his commitment to enhancing technology in the field. His contributions are valuable to the advancement of raster scan systems and reflect his dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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