This inventor holds 1 USPTO granted patent. Top assignee: Gamma-Metrics. Active years: 1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991
Title: The Innovative Contributions of Richard L. Conwell
Introduction
Richard L. Conwell is a notable inventor based in Del Mar, California. He has made significant contributions to the field of material analysis through his innovative designs and patents. His work focuses on enhancing the efficiency and accuracy of material testing processes.
Latest Patents
One of Richard L. Conwell's key patents is for a "Material Analyzer with Carousel." This invention includes a container that houses a radiation source and a detector. The detector is designed to detect radiation that is secondarily emitted by a material sample when bombarded by radiation from the source. The system processes the signals produced to determine the content of the material sample. A unique feature of this invention is the carousel that transports material samples from outside the container to the activation region. The carousel operates around an axis of rotation and includes sample containment chambers that facilitate the movement of samples for analysis.
Career Highlights
Richard L. Conwell has been associated with Gamma-Metrics, a company that specializes in advanced measurement technologies. His work at Gamma-Metrics has allowed him to develop innovative solutions that improve material analysis techniques. With a patent portfolio that includes 1 patent, he has established himself as a key figure in his field.
Collaborations
Richard has collaborated with notable colleagues such as Scott C. Christensen and Raymond J. Proctor. These collaborations have contributed to the advancement of technology in material analysis.
Conclusion
Richard L. Conwell's contributions to the field of material analysis through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the industry and improve material testing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile