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USPTO Data Jan 1 1976 - Oct 20 2026
11 Patents
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#223 in
#27,529 in US
#51,801 in the World
Gamma-Metrics
Forward Citations = 124
18 inventors:
Gamma-Metrics
Forward Citations = 124
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18 inventors (with patents filed for the assignee):
Raymond J Proctor (5 out of 8 patents)
Clinton LaMar Lingren (4 out of 20 patents)
James Francis Miller (4 out of 12 patents)
4. Thomas L Atwell (4 out of 4 patents)
5. Michael J Hurwitz (3 out of 3 patents)
6. Chris A Isaacson (3 out of 6 patents)
7. James P Stronski (2 out of 3 patents)
8. Siaka Yusuf (2 out of 2 patents)
9. Andrew H Smith (2 out of 2 patents)
10. Chaur-Ming Shyu (1 out of 4 patents)
11. Richard Louis Conwell (1 out of 15 patents)
12. Craig A Griebel (1 out of 1 patent)
13. Kim-Chinh Tran (1 out of 1 patent)
14. Scott C Christensen (1 out of 1 patent)
15. Richard L, Conwell (1 out of 1 patent)
11 patents:
Company Overview
Gamma-Metrics is a US-based company specializing in advanced measurement and monitoring solutions. The organization focuses on developing innovative technologies that enhance data accuracy and reliability across various industries. With a strong emphasis on research and development, Gamma-Metrics is dedicated to creating products that improve operational efficiency and decision-making processes. Their expertise spans multiple domains, including environmental monitoring, industrial applications, and scientific research, positioning them as a leader in precision measurement technologies.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Gamma-Metrics. Retrieved from https://idiyas.com/company/gamma-metrics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]