Mansfield, MA, United States of America

Richard J Mahoney, Iii

This inventor holds 2 USPTO granted patents. Top assignee: Instron Limited. Active years: 1994-1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard J Mahoney, Iii. Retrieved from https://idiyas.com/inventor/richard-j-mahoney-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.1

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994-1995

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2 patents (USPTO):Explore Patents

Title: Innovator Spotlight: Richard J. Mahoney, III

Introduction: Richard J. Mahoney, III is an accomplished inventor based in Mansfield, MA (US), with a notable portfolio of 2 patents. His innovative spirit and contributions in the field of materials testing instruments have earned him recognition in the industry.

Latest Patents: One of Mahoney's latest patents is for a "Test frame," a cutting-edge testing machine frame designed to enhance efficiency and accuracy in testing processes. Another patent focuses on a "Stress:strain materials testing instrument," showcasing his expertise in developing advanced technologies for material analysis.

Career Highlights: Mahoney is affiliated with Instron Limited, a renowned company in the field of materials testing. His work at Instron Limited reflects his commitment to advancing testing methodologies and equipment for various industries.

Collaborations: Throughout his career, Mahoney has collaborated with talented individuals such as Paulo A. Martin and Graham E. Mead, enriching his projects with diverse perspectives and expertise. These collaborations have resulted in innovative solutions and successful outcomes in the realm of materials testing.

Conclusion: Richard J. Mahoney, III stands as a prominent figure in the world of material testing innovation, with a track record of successful patents and industry collaborations. His dedication to pushing the boundaries of technology continues to inspire future generations of inventors and innovators in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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