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USPTO Data Jan 1 1976 - Oct 6 2026
22 Patents
#5 in Canton, MA
#903 in Massachusetts
#15,021 in US
#28,749 in the World
Instron Limited
Forward Citations = 204
30 inventors:
Canton, MA, United States of America
Instron Limited
Trademarks = 8
Forward Citations = 204
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30 inventors (with patents filed for the assignee):
Paul D Hayford (3 out of 6 patents)
Stephen Michael McMahon (3 out of 7 patents)
John J Merck, Jr (3 out of 3 patents)
4. Richard Conti (3 out of 3 patents)
5. Paulo A Martin (3 out of 3 patents)
6. David W Scanlon (3 out of 3 patents)
7. David W Long (2 out of 2 patents)
8. Jon Wyman (2 out of 2 patents)
9. Graham E Mead (2 out of 2 patents)
10. Richard J Mahoney, Iii (2 out of 2 patents)
11. Charles W Kellstedt (2 out of 10 patents)
12. Joel M Lieblein (2 out of 12 patents)
13. Raymond David Lohr (1 out of 9 patents)
14. Chanchal Singh Bahra (1 out of 1 patent)
15. Joerg Meissner (1 out of 1 patent)
22 patents:
Company Overview
Instron Limited is a leading provider of testing equipment and services, specializing in materials testing and structural testing solutions. The company develops advanced systems for evaluating the mechanical properties of materials, components, and structures across various industries, including aerospace, automotive, and biomedical. With a strong focus on innovation, Instron integrates cutting-edge technology into its products to enhance testing accuracy and efficiency, serving clients globally from its headquarters in Canton, Massachusetts.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Instron Limited. Retrieved from https://idiyas.com/company/instron
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]