Budd Lake, NJ, United States of America

Richard H Kunz

This inventor holds 1 USPTO granted patent. Top assignee: Ohaus Scale Corporation. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard H Kunz. Retrieved from https://idiyas.com/inventor/richard-h-kunz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Richard H Kunz - Revolutionizing Digital Weighing Scales

Introduction:

Richard H Kunz, a talented inventor based in Budd Lake, NJ, has made significant contributions in the field of digital weighing scales with his groundbreaking patent.

Latest Patents:

Richard's notable patent is for a 'Digital Weighing Scale with Selectable Computational Parameters.' This innovation allows users to vary computational parameters in a digital weighing scale, enhancing its functionality and user-friendliness.

Career Highlights:

Currently working at Ohaus Scale Corporation, Richard has demonstrated his expertise in developing cutting-edge solutions for accurate and efficient weighing scales. His commitment to innovation has earned him recognition in the industry.

Collaborations:

Richard collaborates closely with coworkers Clinton L Gumberich and Armando J Visioli, Jr., pooling their collective skills and knowledge to drive advancements in digital weighing scale technology. Their teamwork exemplifies the power of collaboration in fostering innovation.

Conclusion:

Richard H Kunz's inventive spirit and dedication to enhancing digital weighing scales highlight his passion for innovation. His patent stands as a testament to his ingenuity and impact in shaping the future of weighing scale technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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