Florham Park, NJ, United States of America

Ohaus Scale Corporation


USPTO Granted Patents = 12

Trademarks = 7

Forward Citations = 120

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18 inventors (with patents filed for the assignee):

goldMedal Earl D Myers (3 out of 3 patents)

silverMedal Daniel G Scheffer (3 out of 3 patents)

bronzeMedal Errol P EerNisse (2 out of 22 patents)

4.  Christopher W Brock (2 out of 2 patents)

5.  Marilyn A Brock (2 out of 2 patents)

6.  Jerome M Paros (1 out of 19 patents)

7.  Walter P Kistler (1 out of 24 patents)

8.  Robert B Wiggins (1 out of 5 patents)

9.  Armando J Visioli, Jr (1 out of 2 patents)

10.  Richard K Walker (1 out of 1 patent)

11.  John P Hanley (1 out of 4 patents)

12.  Richard H Kunz (1 out of 1 patent)

13.  Clinton L Gumberich (1 out of 1 patent)

14.  Mark D Gaiser (1 out of 1 patent)

15.  Douglas B Schumer (1 out of 1 patent)


12 patents:

Company Overview
Ohaus Scale Corporation, headquartered in Florham Park, NJ, specializes in the design and manufacture of precision weighing instruments and measurement solutions. The company offers a diverse range of products, including balances, scales, and analytical instruments, catering to various industries such as education, laboratory, and industrial sectors. Ohaus is recognized for its commitment to quality and innovation, providing reliable and user-friendly solutions that enhance productivity and accuracy in measurement applications globally.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

12 Patents

#13 in Florham Park, NJ

#961 in New Jersey

#25,557 in US

#48,163 in the World

Florham Park, NJ (US)
Florham Park, NJ, United States of America
Forward Citations = 120

18 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ohaus Scale Corporation. Retrieved from https://idiyas.com/company/ohaus-scale

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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