San Carlos, CA, United States of America

Richard G Egan

This inventor holds 1 USPTO granted patent. Top assignee: Inapac Technology, Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard G Egan. Retrieved from https://idiyas.com/inventor/richard-g-egan-bpojxh01

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Richard G Egan: Innovator in Electronic Device Manufacturing

Introduction

Richard G Egan is a notable inventor based in San Carlos, CA (US). He has made significant contributions to the field of electronic device manufacturing. His innovative approach has led to advancements that improve the efficiency and reliability of electronic devices.

Latest Patents

Egan holds 1 patent for a system related to component testing and recovery. This patent discloses methods for producing electronic devices that include excess circuits. These excess circuits serve as replacements for defective circuits found within the electronic device. The replacement process is designed to enhance manufacturing yields compared to prior art.

Career Highlights

Richard G Egan is associated with Inapac Technology, Inc., where he applies his expertise in electronic device manufacturing. His work focuses on developing systems that streamline the production process and improve product quality.

Collaborations

Egan collaborates with Adrian E Ong, contributing to innovative projects within the company. Their teamwork fosters an environment of creativity and technical advancement.

Conclusion

Richard G Egan's contributions to electronic device manufacturing exemplify the impact of innovation in technology. His patent on component testing and recovery showcases his commitment to improving manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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