Colchester, VT, United States of America

Richard E Hee

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard E Hee. Retrieved from https://idiyas.com/inventor/richard-e-hee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of Richard E. Hee

Introduction

Richard E. Hee is a notable inventor based in Colchester, Vermont, who has made significant contributions to the field of semiconductor technology. His innovative approach to burn-in testing has led to advancements that enhance the reliability and efficiency of semiconductor devices.

Latest Patents

Richard E. Hee holds a patent for an "Efficient semiconductor burn-in circuit and method of operation." This invention provides a circuit and burn-in test method for semiconductor devices that increases the speed of burn-in tests. The method allows each device under test to be tested multiple times during each power cycle, significantly shortening the total test time. The invention has been shown to stress devices more efficiently, resulting in greater reliability compared to prior art tests.

Career Highlights

He is associated with International Business Machines Corporation (IBM), where he has contributed to various projects in semiconductor technology. His work has focused on improving the testing processes for memory and logic devices, ensuring that they meet high standards of performance and reliability.

Collaborations

Richard has collaborated with notable colleagues such as George Maria Braceras and James J. Covino, further enhancing the innovative efforts within his field.

Conclusion

Richard E. Hee's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work not only improves testing efficiency but also enhances the reliability of semiconductor devices, marking him as a significant figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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