Vancouver, Canada

Richard D Neufeld

This inventor holds 1 USPTO granted patent. Top assignee: Mpr Teltech Ltd.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard D Neufeld. Retrieved from https://idiyas.com/inventor/richard-d-neufeld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Richard D. Neufeld

Introduction

Richard D. Neufeld is a notable inventor based in Vancouver, Canada. He has made significant contributions to the field of electrical engineering, particularly in the measurement of dielectric properties. His work has implications for various applications in technology and materials science.

Latest Patents

Richard D. Neufeld holds a patent for a "Method and apparatus for measuring the electrical properties of a dielectric test device." This innovative device is formed on a substrate that includes a conductive ground plane layer, a dielectric layer, and conductive strips. The design allows for the measurement of interference patterns at the output node, enabling the calculation of effective dielectric constant, propagation velocity as a function of frequency, and attenuation.

Career Highlights

Neufeld has been associated with MPR Teltech Ltd., where he has applied his expertise in developing advanced measurement techniques. His work has contributed to enhancing the understanding of electrical properties in various materials.

Collaborations

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Conclusion

Richard D. Neufeld's innovative work in electrical measurement techniques showcases his valuable contributions to the field. His patent reflects a deep understanding of dielectric properties, which can lead to advancements in technology and materials science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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