The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1991
Filed:
Mar. 19, 1990
Richard D Neufeld, Vancouver, CA;
MPR Teltech Ltd., Burnaby, CA;
Abstract
A dielectric test device formed on a substrate which includes a conductive ground plane layer formed over the substrate, a dielectric layer over the ground plane layer and a short and long conductive strip overlying the dielectric layer. Each of the long and short strips extends between common input and output conductive pads and are substantially identical in all respects except for length. Measurement of the interference pattern at the output node resulting from an input signal of a single frequency applied to the input node as frequency is varied over the gigahertz range allows the calculation of effective dielectric constant, propagation velocity as a function of frequency and attenuation.