This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2006.
Company Filing History:
Years Active: 2006
Title: The Innovations of Richard A. Lawrence
Introduction
Richard A. Lawrence is an accomplished inventor based in Wylie, Texas. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for detecting outlier semiconductor devices.
Latest Patents
Richard holds a patent for a "Method for test data-driven statistical detection of outlier semiconductor devices." This method involves performing a burn-in test on a plurality of sample semiconductor dies to identify defective units. By correlating variations in specific parameters with failures, he defines constraints that help in identifying production semiconductor dies that may pass tests but fail to conform to expected standards.
Career Highlights
Richard A. Lawrence is associated with Texas Instruments Corporation, a leading company in semiconductor manufacturing. His work has been instrumental in enhancing the reliability and performance of semiconductor devices. With a focus on statistical detection methods, he has contributed to improving testing processes in the industry.
Collaborations
Richard has collaborated with notable colleagues such as Suresh Subramaniam and John M. Carulli. Their combined expertise has fostered advancements in semiconductor testing methodologies.
Conclusion
Richard A. Lawrence's innovative contributions to semiconductor technology exemplify the impact of dedicated inventors in the field. His patent and collaborative efforts continue to influence the industry positively.
