The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Sep. 10, 2004
Suresh Subramaniam, Richardson, TX (US);
Kenneth M. Butler, Richardson, TX (US);
John M. Carulli, Richardson, TX (US);
Richard A. Lawrence, Wylie, TX (US);
Suresh Subramaniam, Richardson, TX (US);
Kenneth M. Butler, Richardson, TX (US);
John M. Carulli, Richardson, TX (US);
Richard A. Lawrence, Wylie, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method for test data-driven detection of outlier semiconductor devices. Some illustrative embodiments may be a method used to test a semiconductor die comprising performing a burn-in test of a plurality of sample semiconductor dies to identify a failure of a defective semiconductor die, correlating variations in a parameter with the failure (the parameter comprising a characteristic associated with the plurality of sample semiconductor dies), defining a parameter constraint associated with the parameter, performing a production test of a production semiconductor die, and identifying the production semiconductor die as an outlier semiconductor die (the outlier semiconductor die passing the production test, but failing to conform to the parameter constraint).