Chandler, AZ, United States of America

Rich Campbell

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Precision, Inc.. Active years: 2004.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 135(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: **The Innovative Mind of Rich Campbell: A Pioneer in Probe Card Technology**

Introduction

Rich Campbell, based in Chandler, AZ, is an accomplished inventor known for his significant contributions to the field of electronics and semiconductor technology. With one patent to his name, Campbell has demonstrated his ability to create solutions that enhance the functionality and efficiency of electronic inspection systems.

Latest Patents

Rich Campbell's noteworthy patent is titled "Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card". This innovation focuses on a probe card inspection system that utilizes a fiduciary plate embedded with multiple targets. Employing advanced techniques such as photolithography and vapor deposition, the system allows semiconductor probe card probe tips to accurately contact the fiducial pattern. An electronic imaging system captures the positions of the geometric centroids of the probe tips in relation to an index mark within the fiduciary pattern. Through the analysis performed by a central processor, the relative positions of each probe tip are calculated with precision. This advancement not only improves inspection accuracy but also streamlines the testing process in circuit board manufacturing.

Career Highlights

Currently, Rich Campbell is associated with Applied Precision, Inc., a company renowned for its innovative solutions in precision measurement and inspection. His role there exemplifies his commitment to pushing the boundaries of technology in the semiconductor industry.

Collaborations

Throughout his career, Campbell has had the opportunity to work alongside esteemed colleagues such as Ron Hershel and Timothy S Killeen. These collaborations have allowed him to leverage combined expertise, further enhancing the quality and impact of his inventions.

Conclusion

Rich Campbell’s contributions to the realm of electronic inspection systems showcase the ingenuity and critical thinking of a true inventor. His patent not only addresses the challenges in probe card technology but also sets a foundation for future innovations in the industry. As technologies evolve, it will be interesting to see how Campbell’s work continues to influence advancements in semiconductor testing and beyond.

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