IDiyas

For the Inventor, By the Inventor

Hwaseong-si, South Korea

Reum Oh

USPTO Granted Patents = 33 


Average Co-Inventor Count = 3.4

ph-index = 6

Forward Citations = 153(Granted Patents)


Location History:

  • Seoul, KR (2005 - 2012)
  • Hwaseong-si, KR (2018 - 2024)

Company Filing History:

goldMedal33 out of 131,214 
 
Samsung Electronics Co., Ltd.
 patents

Years Active: 2005-2025

Loading Chart...
Loading Chart...
33 patents (USPTO):Explore Patents
1. 12299296 - Semiconductor memory device and method of adjusting operation condition of the same (2025-05-13),
2. 12250807 - Semiconductor device using different types of through-silicon-vias (2025-03-11),
3. 12203980 - Wafer level methods of testing semiconductor devices using internally-generated test enable signals (2025-01-21),
4. 11867751 - Wafer level methods of testing semiconductor devices using internally-generated test enable signals (2024-01-09),
5. 11829224 - Method of operating memory device and memory device performing the same (2023-11-28),
6. 11681457 - High bandwidth memory device and system device having the same (2023-06-20),
7. 11599301 - Semiconductor memory device and system including the same (2023-03-07),
8. 11538506 - Semiconductor device and semiconductor package including the semiconductor device (2022-12-27),
9. 11435397 - Wafer level methods of testing semiconductor devices using internally-generated test enable signals (2022-09-06),
10. 11334282 - High bandwidth memory device and system device having the same (2022-05-17),
11. 11239210 - Semiconductor die for determining load of through silicon via and semiconductor device including the same (2022-02-01),
12. 11194505 - High bandwidth memory device and system device having the same (2021-12-07),
13. 10996885 - High bandwidth memory device and system device having the same (2021-05-04),
14. 10916525 - Semiconductor die for determining load of through silicon via and semiconductor device including the same (2021-02-09),
15. 10768824 - Stacked memory device and a memory chip including the same (2020-09-08),

Title: The Innovative Contributions of Reum Oh in Semiconductor Testing

Introduction

Reum Oh, a prominent inventor based in Hwaseong-si, South Korea, has made significant strides in the field of semiconductor technology with a remarkable portfolio of 31 patents. His work is primarily focused on advancing testing methodologies for integrated circuit (IC) devices, showcasing his commitment to innovation in the electronics industry.

Latest Patents

Among Reum Oh's latest contributions is a groundbreaking wafer-level method of testing semiconductor devices which utilizes internally-generated test enable signals. This intricate process involves applying multiple test operation signals to a wafer containing the IC device, generating a test enable signal upon detecting a toggling of any of these signals, and subsequently testing a portion of the IC device based on the generated signal. The method also includes the capability to generate the test enable signal in response to an inactive-to-active transition of a toggle detection signal, enhancing the testing accuracy and efficiency of semiconductor devices.

Career Highlights

Reum Oh has built a remarkable career largely within well-known corporations, including Samsung Electronics Co., Ltd. His extensive experience and innovative mindset have made him a reputable figure in the field of semiconductor research and development. His 31 patents reflect a deep understanding of both the theoretical and practical aspects of semiconductor technology.

Collaborations

Throughout his career, Reum Oh has collaborated with esteemed colleagues such as Je-Min Ryu and Pavan Kumar Kasibhatla. These collaborations have undoubtedly contributed to the refinement and success of his patented technologies, enhancing both the functionality and reliability of semiconductor devices.

Conclusion

In conclusion, Reum Oh’s dedication to innovation is evident through his 31 patents and his influential work in testing methods for semiconductor devices. As the technology evolves, his contributions are likely to play a critical role in shaping the future of semiconductor testing, paving the way for advancements that could transform the industry.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…