This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Mitutoyo Corporation. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Reiya Otao: Innovator in Grazing Incidence Interferometry
Introduction
Reiya Otao is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique grazing incidence interferometer.
Latest Patents
Reiya Otao holds 1 patent for his invention of a grazing incidence interferometer. This device is designed to measure the profile of a target surface by utilizing a measurement beam that is directed obliquely to the normal line of the surface. The measurement beam reflects off the target surface and interferes with a reference beam. The interferometer comprises several key components, including a light source, polarization beam splitters, a ratio changer, and an image capturing camera.
Career Highlights
Reiya Otao is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to further develop his expertise in optical measurement systems. Otao's contributions have been instrumental in advancing the capabilities of measurement devices.
Collaborations
Reiya Otao collaborates with Yoshimasa Suzuki, a talented woman in the field. Their partnership has fostered innovation and creativity in their projects.
Conclusion
Reiya Otao's work in developing the grazing incidence interferometer showcases his dedication to advancing measurement technology. His contributions continue to impact the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile