This inventor holds 2 USPTO granted patents. Top assignees: Infineon Technologies Richmond, LP, Siemens Aktiengesellschaft. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Richmnond, VA (US) (2002)
- Richmond, VA (US) (2002)
Company Filing History:
1 out of 48 
1 out of 30,874 
Years Active: 2002
Title: Reinhold Ott: Innovator in Yield Prediction and Statistical Process Control
Introduction
Reinhold Ott is a notable inventor based in Richmond, VA (US), recognized for his contributions to the field of semiconductor technology. He holds 2 patents that focus on yield prediction and statistical process control, which are crucial for enhancing the efficiency of semiconductor manufacturing processes.
Latest Patents
One of his latest patents is titled "Yield prediction and statistical process control using predicted defect related yield loss." This invention outlines a method for determining yield loss for a device by assessing killing probabilities linked to inspection parameters based on historical data. The method involves classifying defects according to these parameters and calculating predicted yield loss while applying statistical process control to all in-line inspection steps.
Another significant patent is "System and method for determining yield impact for semiconductor devices." This method correlates defects on semiconductor dies to electrical failures, allowing for the computation of kill rates and the determination of yield loss for each inspection process. This innovative approach aids in optimizing the manufacturing process for semiconductor wafers.
Career Highlights
Reinhold has worked with prominent companies in the semiconductor industry, including Infineon Technologies Richmond, LP and Siemens Aktiengesellschaft. His experience in these organizations has contributed to his expertise in yield prediction and process control.
Collaborations
Throughout his career, Reinhold has collaborated with notable professionals such as Herbert Lammering and Heinrich Ollendorf. These collaborations have further enriched his work and innovations in the field.
Conclusion
Reinhold Ott's contributions to yield prediction and statistical process control have significantly impacted the semiconductor industry. His innovative patents and career achievements reflect his dedication to advancing technology in this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile