Munich, Germany

Reda Jebari

This inventor holds 1 USPTO granted patent. Top assignee: Amadeus S.a.s.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Reda Jebari. Retrieved from https://idiyas.com/inventor/reda-jebari-ipk9tiov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Reda Jebari: Innovator in Data Logging Technologies

Introduction

Reda Jebari is a notable inventor based in Munich, Germany. He has made significant contributions to the field of data logging through his innovative methods and systems. His work focuses on enhancing the efficiency of data management processes.

Latest Patents

Reda Jebari holds a patent for "Methods and systems for overtruncation of data logs." This patent describes a data logging method that includes obtaining a data record with an initial size, determining if this size exceeds a primary threshold, and generating a truncated data record if necessary. The truncated data record is then stored in a log repository, ensuring effective data management.

Career Highlights

Reda Jebari is currently employed at Amadeus S.a.s., where he applies his expertise in data logging technologies. His innovative approach has positioned him as a valuable asset in his field. He has successfully developed solutions that address common challenges in data management.

Collaborations

Reda has collaborated with talented individuals such as Tony Bisegna and Jeremy Buchholtzer. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Reda Jebari's contributions to data logging technologies exemplify his commitment to innovation. His patent and collaborative efforts highlight his role as a key figure in advancing data management solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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