The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Sep. 17, 2024
Applicant:

Amadeus S.a.s., Biot, FR;

Inventors:

Tony Bisegna, Vallauris, FR;

Reda Jebari, Villeneuve-loubet, DE;

Jeremy Buchholtzer, Biot, FR;

Jeremy Junac, Villeneuve Loubet, FR;

Benjamin Rey, Antibes, FR;

Assignee:

AMADEUS S.A.S., Biot, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/23 (2019.01); G06F 17/00 (2019.01); H04L 69/22 (2022.01);
U.S. Cl.
CPC ...
G06F 16/2358 (2019.01); H04L 69/22 (2013.01);
Abstract

A data logging method includes: obtaining a data record having an initial size; determining that the initial size exceeds a primary threshold; in response to determining that the initial size exceeds the primary threshold, generating a truncated data record by truncating the data record to a secondary size, wherein the secondary size is smaller than the primary threshold; and storing the truncated data record in a log repository.


Find Patent Forward Citations

Bisegna, Tony. (2026). Methods and systems for overtruncation of data logs (U.S. Patent No. 12650973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12650973

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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