Dayton, OH, United States of America

Randall C Gantner


Average Co-Inventor Count = 5.1

ph-index = 3

Forward Citations = 128(Granted Patents)


Company Filing History:


Years Active: 1991-1996

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3 patents (USPTO):Explore Patents

Title: Innovations of Randall C Gantner

Introduction

Randall C Gantner is an accomplished inventor based in Dayton, OH (US). He has made significant contributions to the field of machine vision and surface measurement technologies. With a total of 3 patents to his name, Gantner's work has had a notable impact on various industrial processes.

Latest Patents

Gantner's latest patents include a "Method for measuring the contour of a surface" and a "Machine vision system." The first patent describes a method that utilizes a high-intensity light source and optics to project a line of light onto a surface. This method illuminates a selected contour feature, allowing an optical detector to generate an image of that feature. A processing unit then fits contour segments to the image and determines contour characteristics, incorporating a calibration step to correct for distortion. The second patent outlines a vision system designed to automate machine processes. This system employs a conventional CCD camera and a vision processor to determine process parameters from a workpiece surface. It is particularly useful in laser welding applications, where it can locate workpiece edges and calculate essential parameters such as weld location and laser intensity.

Career Highlights

Gantner is currently employed at General Electric Company, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the efficiency and accuracy of various manufacturing processes.

Collaborations

Some of Gantner's notable coworkers include Rajendra P Rathi and David G Tashjian. Their collaborative efforts have contributed to the advancement of technologies in their respective fields.

Conclusion

Randall C Gantner's contributions to innovation in machine vision and surface measurement are commendable. His patents reflect a commitment to improving industrial processes through technology.

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