General Electric Company

Randall C Gantner

David G Tashjian

Rajendra P Rathi

John J Bottoms

Richard H Burkel

Steven M Wolff

Charles W Donaldson

John J Lestage

Kenneth E Miller

A method for measuring the contour of a surface using a high intensity light source, optics for projecting a line of light on the surface to illuminate a selected contour feature of the surface, an optical detector which generates an image of the selected contour feature, and a processing unit which fits at least one contour segment to the image of the selected contour feature and determines contour characteristics from the contour segment. The method includes a calibration step which corrects for distortion and keystone effect in the image caused by off-axis imaging of the illuminated contour feature by adjusting vertical and horizontal grid lines of an electronically created image with the off-axis image of the contour surface.

Method for measuring the contour of a surface

A vision system for automating a machine process. The system includes a conventional CCD camera and a vision processor which automatically determines process parameters from a workpiece surface by generating an image of the workpiece surface, transducing the workpiece image into electrical signals, and electronically determining the process parameters from the electrical signals. Applied to a laser welding process, the vision system locates workpiece edges, determines part centerline and thickness, and calculates process parameters such as weld location, the rate of delivery of weld powder, laser intensity, and the speed at which the weld is applied.

Machine vision system

Growing community of inventors

Dayton, OH, United States of America

Randall C Gantner