Cupertino, CA, United States of America

Randal S Thelen

This inventor holds 1 USPTO granted patent. Top assignee: Apple Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Randal S Thelen. Retrieved from https://idiyas.com/inventor/randal-s-thelen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Randal S. Thelen and Concurrent Hardware Validation

Introduction

Randal S. Thelen is an inventor associated with Cupertino, California, and Apple Inc. His patent work addresses methods for validating hardware units within an integrated circuit.

Latest Patents

Thelen is credited with 1 patent, titled “Concurrent Validation of Hardware Units.” The invention describes holding definitions of software-implemented tests for one or more integrated-circuit hardware units, along with conditions that determine whether each test may run. A processor in the integrated circuit applies the tests at least partially in parallel, tracking their execution states and evaluating the conditions to invoke tests that are permitted to run but are not currently active.

Career Highlights

The available information associates Thelen with Apple Inc. and identifies his patent contribution in the area of concurrent hardware validation. The described method coordinates multiple tests while respecting their invocation conditions.

Collaborations

Thelen’s listed coworkers include Yair Dagan and Yuval Gonczarowski. The provided information does not specify their roles in the patent or their particular contributions.

Conclusion

Randal S. Thelen’s patent describes a coordinated approach to running software-based tests on integrated-circuit hardware, enabling eligible tests to proceed at least partially in parallel.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…